DOM: Nov 2016
Condition: Inline with its age
Usage : 445 hrs
Product installation requirements:
Facilities: AC120V, 50/60Hz, 1.3kVA or less
Dims: 2110mm(W) X 1000mm(D) X 1350mm(H) @ 300kg
This unit is located in the CEE facility in the Chicago area. A CEE technician will demonstrate the unit fully functional either live or by video for your acceptance. Availability is subject to prior sale.
Software: HORIBA Smartmap Software built on the INCA(TM)* platform, for maximum productivity and sample throughput
Note: System includes table shown in the pictures.
The XGT-7200V X-Ray Analytical Microscope has been designed to simutaneously measure and analyze the transmitted X-ray image, fluorescent X-ray image, and X-ray spectrum of a sample. The XGT-7200V allows you to analyze the elements contained in a sample
(qualitative analysis) and the content of a certain element (quantitative analysis). It is also capable of analyzing the inner structure of a sample using transmitted X-rays as well as analyzing the distribution of elements using the mapping function. By using the X-ray Guide Tube (XGT), the X-ray can be narrowed down without reducing the intensity, enabling a microanalysis in a shorter time.
Instead of using a conventional detector that mist be cooled with liquid nitrogen, the XGT-7200V uses a silicon drift detector (SDD). Since liquid nitrogen is not need, there is substantial labor savings in both handling and maintenance.
The software installed in the XGT-7200V is compatible with Microsoft Windows, so that anybody can operate it.
A handy clipboard enables spectrums, analysis results, images, and other data to be transfered to other MS Windows compatible programs.
High speed, high accuracy element mapping
High energy resolution - high count rate [10x increase in count rate (compared with conventional XGT-7000V)]
Analysis of solid, liquid, powder and hydroscopic samples
Versatility: analysis area ranging from 10μm to 100mm2 mapping
Liquid nitrogen (LN2) free
Measurement principle: Energy dispersive X-ray fluorescence
X-ray beam diameter: Select from φ10μm, 50μm, 100μm, 400μm, 1.2mm
Detectable elements: Na-U
Sample chamber atmosphere: Open air/Vacuum Switchable
Chamber size: 450(W) × 500(D) × 80(H) mm
Rated Output: 50kV 1,0mA
Information is provided for your convenience as our good faith estimate for this equipment. CEE does not warrant the accuracy of this information due to the nature of used equipment. Used equipment can be customized, altered, or simply worn beyond the capability to perform to original specifications. If certain details are critical for your application, we highly recommend testing the machines performance on that criteria. Please notify your CEE sales representative prior to purchase and we will propose solutions for your concerns. CEE's goal is always to minimize your risk.