Horiba XGT-7200V X-ray Analytical Microscope

Horiba XGT-7200V X-ray Analytical Microscope {ID: 7642}

Status: Available
DOM: Nov 2016
Condition: Inline with its age
Quantity: 1
Usage : 445 hrs

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Product installation requirements:

Facilities: AC120V, 50/60Hz, 1.3kVA or less
Dims: 2110mm(W) X 1000mm(D) X 1350mm(H) @ 300kg

Product Terms:

This unit is located in the CEE facility in the Chicago area. A CEE technician will demonstrate the unit fully functional either live or by video for your acceptance.  Availability is subject to prior sale.


Configuration

  • Silicon Drift Detector (SDD) with energy resolution of <143 eV (K line of Mn), eliminates the need for liquid nitrogen.
  • 50W X-Ray generator: up to 50kV acceleration voltage, 1mA. Rh target
  • Two X-Ray guide tubes (50µm and 1.2µm)
  • Energy range: 0-40 keV, elements detected: Na to U
  • Video Camera 1: (x100) enhanced optical image of sample. Observation is coaxial with the X-Ray beam due to a special patented design (HORIBA Patent 2900086
  • Video Cameras 2: 5M pixels whole stage view optical image
  • Video camera 3: Height adjustment video image
  • High precision XY mapping stage. Minimum step 2 microns. Scanning Range: Maximum 100 mm x 100 mm x 60mm
  • Maximum Sample Size: 350mm x 400mm x 85mm
  • Mechanical vacuum pump

Software: HORIBA Smartmap Software built on the INCA(TM)* platform, for maximum productivity and sample throughput

  • OS: Windows 7 (32-bit)
  • Hyperspectral imaging acquisition, processing and presentation software
  • Quantitative Analysis Functions: FPM Quantification (standardless, 1-point calibration), Analytical Calibration Curve Quantification
  • Mapping Analysis: Simultaneous Mapping of the X-ray transmission Image and Fluorescence Image, Pseudo Color, RGB

Note: System includes table shown in the pictures.


Description

The XGT-7200V X-Ray Analytical Microscope has been designed to simutaneously measure and analyze the transmitted X-ray image, fluorescent X-ray image, and X-ray spectrum of a sample. The XGT-7200V allows you to analyze the elements contained in a sample
(qualitative analysis) and the content of a certain element (quantitative analysis). It is also capable of analyzing the inner structure of a sample using transmitted X-rays as well as analyzing the distribution of elements using the mapping function. By using the X-ray Guide Tube (XGT), the X-ray can be narrowed down without reducing the intensity, enabling a microanalysis in a shorter time.

Instead of using a conventional detector that mist be cooled with liquid nitrogen, the XGT-7200V uses a silicon drift detector (SDD).  Since liquid nitrogen is not need, there is substantial labor savings in both handling and maintenance.

The software installed in the XGT-7200V is compatible with Microsoft Windows, so that anybody can operate it.

A handy clipboard enables spectrums, analysis results, images, and other data to be transfered to other MS Windows compatible programs.

  • High speed, high accuracy element mapping

  • High energy resolution - high count rate [10x increase in count rate (compared with conventional XGT-7000V)]

  • Analysis of solid, liquid, powder and hydroscopic samples 

  • Versatility: analysis area ranging from 10μm to 100mm2 mapping

  • Liquid nitrogen (LN2) free

Functionality

  • Simultaneous X-ray fluorescence and X-ray transmission imaging
  • Dual vacuum chamber (either full vacuum or atmospheric pressure analysis)
  • The world's smallest probe size: 10μm
  • Hyperspectral mapping, multipoint analysis (Max 1000 points), and multi-mapping functions are available
  • Easy operation and easy maintenance

Specifications

  • Measurement principle:     Energy dispersive X-ray fluorescence

  • X-ray beam diameter:     Select from φ10μm, 50μm, 100μm, 400μm, 1.2mm

  • Detectable elements:     Na-U    

  • Sample chamber atmosphere:     Open air/Vacuum Switchable

  • Chamber size:     450(W) × 500(D) × 80(H) mm

  • Rated Output:     50kV 1,0mA


Disclaimer

Information is provided for your convenience as our good faith estimate for this equipment. CEE does not warrant the accuracy of this information due to the nature of used equipment. Used equipment can be customized, altered, or simply worn beyond the capability to perform to original specifications. If certain details are critical for your application, we highly recommend testing the machines performance on that criteria. Please notify your CEE sales representative prior to purchase and we will propose solutions for your concerns. CEE's goal is always to minimize your risk.